linux.git/drivers/usb/misc/usbtest.c, branch v2.6.34

USB misc: make USB device id constant

2010-03-02T22:54:17+00:00

The id_table field of the struct usb_device_id is constant in 
so it is worth to make the initialization data also constant.

The semantic match that finds this kind of pattern is as follows:
(http://coccinelle.lip6.fr/)

// 
@r@
disable decl_init,const_decl_init;
identifier I1, I2, x;
@@
	struct I1 {
	  ...
	  const struct I2 *x;
	  ...
	};
@s@
identifier r.I1, y;
identifier r.x, E;
@@
	struct I1 y = {
	  .x = E,
	};
@c@
identifier r.I2;
identifier s.E;
@@
	const struct I2 E[] = ... ;
@depends on !c@
identifier r.I2;
identifier s.E;
@@
+	const
	struct I2 E[] = ...;
// 

Signed-off-by: Németh Márton 
Cc: Julia Lawall 
Cc: cocci@diku.dk
Signed-off-by: Greg Kroah-Hartman

USB: convert to the runtime PM framework

2010-03-02T22:54:12+00:00

This patch (as1329) converts the USB stack over to the PM core's
runtime PM framework.  This involves numerous changes throughout
usbcore, especially to hub.c and driver.c.  Perhaps the most notable
change is that CONFIG_USB_SUSPEND now depends on CONFIG_PM_RUNTIME
instead of CONFIG_PM.

Several fields in the usb_device and usb_interface structures are no
longer needed.  Some code which used to depend on CONFIG_USB_PM now
depends on CONFIG_USB_SUSPEND (requiring some rearrangement of header
files).

The only visible change in behavior should be that following a system
sleep (resume from RAM or resume from hibernation), autosuspended USB
devices will be resumed just like everything else.  They won't remain
suspended.  But if they aren't in use then they will naturally
autosuspend again in a few seconds.

Signed-off-by: Alan Stern 
Signed-off-by: Greg Kroah-Hartman

usbtest: make module param pattern writeable

2009-12-11T19:55:22+00:00

Allow module_param to be writeable. This allows us to change
the parameter if usbtest is built-in in the kernel.

Signed-off-by: Vikram Pandita 
Signed-off-by: Anand Gadiyar 
Cc: David Brownell 
Signed-off-by: Greg Kroah-Hartman

USB: usbtest fix endless loop in unlink tests.

2009-06-16T04:44:48+00:00

In tests 11 and 12 if the URB completes with an error status (eg babble)
the asynchrous unlink entered an endless loop trying to unlink
a non resubmitted URB.

Signed-off-by: Martin Fuzzey 
Acked-by: David Brownell 
Signed-off-by: Greg Kroah-Hartman

USB: clean up redundant tests on unsigned

2009-01-07T17:59:49+00:00

temp, bytes and param->{length,sglen,vary} are unsigned so
these tests do nothing.

Signed-off-by: Roel Kluin 
Signed-off-by: Greg Kroah-Hartman

USB: usbtest.c: length, sglen and vary are unsigned, so cannot be negative

2008-10-22T17:05:28+00:00

length, sglen and vary are unsigned, so cannot be negative

see
vi drivers/usb/misc/usbtest.c +18
struct usbtest_param {
...
        unsigned                iterations;
        unsigned                length;
        unsigned                vary;
        unsigned                sglen;
...
};

Signed-off-by: Roel Kluin 
Signed-off-by: Greg Kroah-Hartman

Rename WARN() to WARNING() to clear the namespace

2008-07-25T17:53:29+00:00

We want to use WARN() as a variant of WARN_ON(), however a few drivers are
using WARN() internally.  This patch renames these to WARNING() to avoid the
namespace clash.  A few cases were defining but not using the thing, for those
cases I just deleted the definition.

Signed-off-by: Arjan van de Ven 
Acked-by: Greg KH 
Cc: Karsten Keil 
Signed-off-by: Andrew Morton 
Signed-off-by: Linus Torvalds

usbtest: comment on why this code "expects" negative and positive errnos

2008-05-14T17:00:29+00:00

On Mon, May 12, 2008 at 01:02:22AM -0700, David Brownell wrote:
> On Sunday 11 May 2008, Marcin Slusarz wrote:
> > 
> > test_ctrl_queue expects (?) positive and negative errnos.
> > what is going on here?
> 
> The sign is just a way to flag something:
> 
>                 /* some faults are allowed, not required */
> 
> The negative ones are required.  Positive codes are optional,
> in the sense that, depending on how the peripheral happens
> to be implemented, they won't necessarily be triggered.
> 
> For example, the test to fetch a device qualifier desriptor
> must succeed if the device is running at high speed.  So that
> test is marked as negative.  But when it's full speed, it
> could legitimately fail; marked as positive.  And so on for
> other tests.
> 
> Look at how the codes are *interpreted* to see it work.

Lets document it.

Based on comment from David Brownell .

Signed-off-by: Marcin Slusarz 
Cc: David Brownell 
Signed-off-by: Greg Kroah-Hartman

USB: usbtest displays diagnostics again

2008-05-02T17:25:52+00:00

Minor cleanup to the "usbtest" driver, mostly to resolve a regression:
all the important diagnostics were at KERN_DEBUG, so that when the
"#define DEBUG" was removed from the top of that file it stopped
providing diagnostics.  Fix by using KERN_ERROR.  Also:

 - Stop using the legacy dbg() calls
 - Simplify the internal debug macros
 - Correct some test descriptions:
	* Test #10 subcase 7 should *always* stall
	* Test #10 subcase 8 *may* stall
 - Diagnostic about control queue test failures is more informative
 - Fix some whitespace "bugs"

And add a warning about the rude interaction between usbfs ioctl()
and khubd during device disconnect ... don't unplug a device under
test, that will wedge.

Signed-off-by: David Brownell 
Signed-off-by: Greg Kroah-Hartman

USB: remove unnecessary type casting of urb->context

2008-04-25T04:16:55+00:00

urb->context code cleanup

Signed-off-by: Ming Lei 
Signed-off-by: Greg Kroah-Hartman