temp, bytes and param->{length,sglen,vary} are unsigned so
these tests do nothing.

Signed-off-by: Roel Kluin <roel.kluin@gmail.com>
Signed-off-by: Greg Kroah-Hartman <gregkh@suse.de>

length, sglen and vary are unsigned, so cannot be negative

see
vi drivers/usb/misc/usbtest.c +18
struct usbtest_param {
...
        unsigned                iterations;
        unsigned                length;
        unsigned                vary;
        unsigned                sglen;
...
};

Signed-off-by: Roel Kluin <roel.kluin@gmail.com>
Signed-off-by: Greg Kroah-Hartman <gregkh@suse.de>

We want to use WARN() as a variant of WARN_ON(), however a few drivers are
using WARN() internally.  This patch renames these to WARNING() to avoid the
namespace clash.  A few cases were defining but not using the thing, for those
cases I just deleted the definition.

Signed-off-by: Arjan van de Ven <arjan@linux.intel.com>
Acked-by: Greg KH <greg@kroah.com>
Cc: Karsten Keil <kkeil@suse.de>
Signed-off-by: Andrew Morton <akpm@linux-foundation.org>
Signed-off-by: Linus Torvalds <torvalds@linux-foundation.org>

On Mon, May 12, 2008 at 01:02:22AM -0700, David Brownell wrote:
> On Sunday 11 May 2008, Marcin Slusarz wrote:
> > 
> > test_ctrl_queue expects (?) positive and negative errnos.
> > what is going on here?
> 
> The sign is just a way to flag something:
> 
>                 /* some faults are allowed, not required */
> 
> The negative ones are required.  Positive codes are optional,
> in the sense that, depending on how the peripheral happens
> to be implemented, they won't necessarily be triggered.
> 
> For example, the test to fetch a device qualifier desriptor
> must succeed if the device is running at high speed.  So that
> test is marked as negative.  But when it's full speed, it
> could legitimately fail; marked as positive.  And so on for
> other tests.
> 
> Look at how the codes are *interpreted* to see it work.

Lets document it.

Based on comment from David Brownell <david-b@pacbell.net>.

Signed-off-by: Marcin Slusarz <marcin.slusarz@gmail.com>
Cc: David Brownell <david-b@pacbell.net>
Signed-off-by: Greg Kroah-Hartman <gregkh@suse.de>

Minor cleanup to the "usbtest" driver, mostly to resolve a regression:
all the important diagnostics were at KERN_DEBUG, so that when the
"#define DEBUG" was removed from the top of that file it stopped
providing diagnostics.  Fix by using KERN_ERROR.  Also:

 - Stop using the legacy dbg() calls
 - Simplify the internal debug macros
 - Correct some test descriptions:
	* Test #10 subcase 7 should *always* stall
	* Test #10 subcase 8 *may* stall
 - Diagnostic about control queue test failures is more informative
 - Fix some whitespace "bugs"

And add a warning about the rude interaction between usbfs ioctl()
and khubd during device disconnect ... don't unplug a device under
test, that will wedge.

Signed-off-by: David Brownell <dbrownell@users.sourceforge.net>
Signed-off-by: Greg Kroah-Hartman <gregkh@suse.de>

urb->context code cleanup

Signed-off-by: Ming Lei <tom.leiming@gmail.com>
Signed-off-by: Greg Kroah-Hartman <gregkh@suse.de>

__FUNCTION__ is gcc-specific, use __func__

Signed-off-by: Harvey Harrison <harvey.harrison@gmail.com>
Signed-off-by: Greg Kroah-Hartman <gregkh@suse.de>

power.power_state is scheduled for removal.  This patch (as1053)
removes all uses of that field from drivers/usb.  Almost all of them
were write-only, the most significant exceptions being sl811-hcd.c and
u132-hcd.c.

Part of this patch was written by Pavel Machek.

Signed-off-by: Alan Stern <stern@rowland.harvard.edu>
Cc: David Brownell <david-b@pacbell.net>
Acked-by: Pavel Machek <pavel@ucw.cz>
Signed-off-by: Greg Kroah-Hartman <gregkh@suse.de>

The kernel.h macro DIV_ROUND_UP performs the computation (((n) + (d) - 1) /
(d)) but is perhaps more readable.

An extract of the semantic patch that makes this change is as follows:
(http://www.emn.fr/x-info/coccinelle/)

// <smpl>
@haskernel@
@@

#include <linux/kernel.h>

@depends on haskernel@
expression n,d;
@@

(
- (n + d - 1) / d
+ DIV_ROUND_UP(n,d)
|
- (n + (d - 1)) / d
+ DIV_ROUND_UP(n,d)
)

@depends on haskernel@
expression n,d;
@@

- DIV_ROUND_UP((n),d)
+ DIV_ROUND_UP(n,d)

@depends on haskernel@
expression n,d;
@@

- DIV_ROUND_UP(n,(d))
+ DIV_ROUND_UP(n,d)
// </smpl>

Signed-off-by: Julia Lawall <julia@diku.dk>
Signed-off-by: Andrew Morton <akpm@linux-foundation.org>
Signed-off-by: Greg Kroah-Hartman <gregkh@suse.de>

This patch (as1062) fixes a bug in the scatter-gather initialization
code in the usbtest driver.  When the sg-helper conversion was
performed, it wasn't done correctly.

Signed-off-by: Alan Stern <stern@rowland.harvard.edu>
CC: Jens Axboe <axboe@kernel.dk>
Signed-off-by: Greg Kroah-Hartman <gregkh@suse.de>